Built-in Logic Block Observation Techniques
25 years ago self test meant a board or system testing itself, possibly under the control of a maintenance computer. This paper started the movement of self-test into ICs, by proposing that signature registers could be used to observe logic block outputs, and that in some cases pseudo-random pattern generators could be used as block test pattern generators. The BILBO circuit introduced here, which combines the TPG and signature registers, is the direct ancestor of the logic BIST we use today.
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