CMOS is Most Testable
This paper presents and reviews several key concepts of considerable
significance for CMOS IC testing. It provided unique insight
into CMOS circuit behavior and stimulated research into new test
methods. It introduced issues from a novel perspective,
including the detection of logic node bridging faults using IDDQ
testing and an interesting method for the identification of
certain types of open circuits. Many people who attended Mark
Levi's presentation were greatly influenced by it and this paper
is still remarkable for its historical and distinctive points of
view.
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