New Techniques for High Speed Analog Testing
When this paper was written, in 1983, analog test had to be done by
switching different sets of expensive instrumentation in and
out. One measurement was done at a time, and most analog
circuits were not thoroughly tested due to time
constraints. This paper made the crucial contribution of
suggesting that DSP techniques be used to generate the analog
waveforms and measure the analog outputs. This allowed different
stimuli to be applied in a coordinated way, and allowed some to
be applied simultaneously, not possible before because of the
difficulty of synchronization. This paper represents a
revolutionary contribution to the art of analog test.
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