CMOS IC Stuck-Open-Fault Electrical Effects and Design
Considerations
The phenomenon of memory ("sequential") behavior that can occur when open circuits exist in certain types of combination circuits was known for some number of years prior to this paper, going back to the 1970s, but this paper provides the first published data with an extensive evaluation of the various physical manifestations and electrical effects of stuck-open faults. The voltage levels, IDDQ magnitudes, steady state and transient responses, and design and test considerations for stuck-open faults are described in detail. This paper received very high interest among the attendees when it was presented and stimulated other investigations and publications about stuck-open faults and related defects and their electrical behavior.
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