ScanBIST: A Multifrequency Scan-based BIST Method
This paper introduced what is now the predominant method of doing Logic BIST - scan BIST. Fundamental benefits were the reuse of scan chains, reducing overhead, and the ability to handle multiple clock domains. Though much engineering work needed to be done, this paper helped to move BIST from an academic curiousity to an accepted DFT method.
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