Structure and Metrology for an Analog Testability Bus
After the adoption of the IEEE 1149.1 standard, attention turned to the parts of a board not covered by the all digital boundary scan. This paper was one of a pair describing the proposed 1149.4 analog test bus standard, that would work with 1149.1 to cover the analog components on a board. After an extensive effort, 1149.4 migrated to becoming an IC analog testability standard, and no widely used standard for analog board test exists today.
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