An Experimental Chip to Evaluate Test Techniques: Experiment Results
This paper describes the "Murphy" experiment led by Stanford University. They designed and had fabricated a test chip which allowed them to compare a number of different test techniques and test pattern generation tools. One interesting result was the discovery that some chips with defects passed tests with 100% stuck-at coverage. This work eventually led to the concept of N-detect testing (multiple detection of target faults) which has gained increasing attention in recent years.
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