Test Generation in VLSI Circuits for Crosstalk Noise
As circuit speeds grow and designs become more aggressive, the chance of cross talk faults increases. Even if design rules are used to mitigate this problem, they may still happen at process corners. This paper was one of the first to describe how to generate tests for these faults, which involves a mixed signal test generator to first generate a crosstalk effect, and then propagate it to an output or flip-flop.
| Go to Paper | Back to Anniversary Page | ITC Home |