Current Ratios: A Self Scaling Technique for Production IDDQ
Testing
IDDQ
testing has many technical issues, both pro and con, and therefore
there are many people that are appropriately advocates or critics or
both because of their own particular views and experiences. The net
effect of all the discussion and controversy about IDDQ testing
through the years has been healthy, because it has stimulated
research and important technical advances. The current ratio IDDQ
test technique is one of these key advances that enabled the
continued use of IDDQ testing through several deep submicron
technology generations. The production data provided in this paper
demonstrated the validity of this technique and provided incentive
for others to use it. It has withstood the test of time and is one of
several methods being used for IDDQ testing of CMOS ICs.
