Wrapper Design for Embedded Core Test
The introduction of System on Chip (SoC) designs led to the need for a test methodology for embedded cores. The authors of this paper were pioneers in defining this as a test wrapper and a test access mechanism, now used as the model for the P1500 proposed core test standard. But wrappers once defined must be implemented, and this paper describes a wrapper generation and verification system, taking SoC test beyond standards and into practice.
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